Azenta. has filed a patent for a system that enables condition monitoring and fault diagnosis. The system includes functions for data collection, pre-processing, analysis, and reasoning to evaluate the condition of components and determine faults in a device. GlobalData’s report on Azenta gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Azenta, Semiconductor fabrication robots was a key innovation area identified from patents. Azenta's grant share as of September 2023 was 58%. Grant share is based on the ratio of number of grants to total number of patents.
A system for automatic fault diagnosis in devices
A recently filed patent (Publication Number: US20230280740A1) describes a system for automatic fault diagnosis. The system includes various functions that work together to identify faults in the operation of mechanical or power components of a device.
The system starts with a data collection function that acquires time histories of selected variables related to the components. These variables can include voltage, torque, velocity, position, tracking error, force, belt tension, and more.
Next, a pre-processing function calculates specific characteristics of the time histories, such as nominal torque, mean and variance of residual torque, and Fourier transforms.
An analysis function then evaluates these characteristics to generate hypotheses about the condition of the components. For example, it can determine if the residual torque exceeds a threshold or identify peak frequencies in the Fourier transform.
Finally, a reasoning function uses these hypotheses to determine the faults of the components or the device itself. It can analyze the Fourier transform peaks to identify the specific fault.
The patent also describes a system for on-demand fault diagnosis. This system operates similarly to the previous one but focuses on acquiring time histories of variables related to a component of a device on an on-demand basis. It can analyze positions, torques, responses, and other variables to identify faults.
The system can also identify problems by comparing parameters of a rigid-body dynamic model of the device with baseline parameters. It can analyze the response of the device to different stimuli, such as positions uniformly distributed on a grid or a swept-frequency harmonic signal.
Additionally, the system can diagnose faults in communication networks connected to the device by analyzing the network's topology. It can also detect shifts in the actual position of a component that cuts a light beam or compare scanned dimensions with known dimensions to determine the condition of a mapper.
Overall, this patent describes a comprehensive system for automatic fault diagnosis that can be used in various devices and components. It utilizes data collection, pre-processing, analysis, and reasoning functions to identify faults and determine their specific nature.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies
