WILCO and Uhlmann / VisioTec to Co-Exhibit the Latest PAT Solutions at INTERPHEX

This year’s INTERPHEX 2010 will take place 20-22 April at the Jacob K Javits Convention Centre in New York.

Both WILCO and Uhlmann / VisioTec will co-exhibit the latest PAT solutions, focusing on the improvement of current lyophilisation (freeze-drying) processes. VisioTec’s NIR sensor technology can perfectly be integrated into WILCO’s headspace analyser or integrity testing machine platforms.

The main topic will be PAT, with several subtitles, such as implementation of new inspection technologies in the pharmaceutical process (headspace analysis by laser absorption, leak detection, NIR), and identifying rogue products after the lyo process (leakage, residual moisture, melt backs, etc.).

We will be showing a fully automatic, 100% laser absorption-based headspace analyser with integrated NIR sensor technology and a code reading and processing camera station at our booth 2229.

Extending this machine concept by a cosmetic inspection module supplied by Eisai Machinery USA, a ‘final quality’ machine concept guarantees that only fully tested and inspected products are labelled and shipped.

WILCO is also proud to announce the newly formed partnership with Eisai Machinery USA, the leading supplier of high-quality pharmaceutical inspection equipment. We are very excited by this new partnership; the time was just right for both WILCO and Eisai Machinery, both the most known and experienced experts in their respective fields, to team up and provide the best possible solutions for our common customer base.

Please also visit Eisai Machinery USA at booth number 2511.

We would be glad to see you in New York.

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