Malvern Instruments product development manager for Process Systems Alon Vaisman will speak about two different analytical techniques and their applications, as part of the particle characterisation session at the 2015 International Forum on Process Analytical Technology and Quality by Design (IFPAC) annual meeting.
The event will take place from 25-28 January, 2015 in Arlington US. The particle characterisation session takes place at IFPAC 2015 during the afternoon of Tuesday 27 January.
Presentations include ‘Applications of Dynamic Light Scattering as PAT for online nano-particle characterisation’ and ‘In-situ monitoring of high shear and fluid bed processing using spatial filter velocimetry’.
Both presentations will discuss and address the growing emphasis in pharmaceutical production.
The continuing importance of large molecule based therapeutics, and the drive to reduce the particulate size of small molecule APIs, is bringing new challenges for in-process particle characterisation.
Automation of dynamic light scattering (DLS) measurements, and the use of this technology as a process analytical tool, is supporting advances in process development and manufacturing control.
‘Applications of Dynamic Light Scattering as PAT for online nano-particle characterisation’ will include examples of the application of online DLS in processes such as nano-milling and emulsification.
‘In-situ monitoring of high shear and fluid bed processing using spatial filter velocimetry’ reviews the implementation of spatial filter velocimetry-based PAT tools for in-situ particle size analysis within fluidised bed and high shear granulation processes during pharmaceutical production.
Examples of the application of the technique to monitor coating layer thickness and detecting agglomeration during Wurster coating will also be discussed.